Design of Mechanical Systems Based on Statistics: A Guide to Improving Product Reliability

This book introduces and explains the parametric accelerated life testing (ALT) methodology as a new reliability methodology based on statistics, to help avoid recalls of products in the marketplace.

The book includes problems and case studies to help with reader comprehension. It provides an introduction to reliability design of the mechanical system as an alternative to Taguchi’s experimental methodology and enables engineers to correct faulty designs and determine if the targeted product reliability is achieved. Additionally, it presents a robust design methodology of mechanical products to withstand a variety of loads.

This book is intended for engineers of many fields, including industrial engineers, mechanical engineers, and systems engineers.

Seong-woo Woo has a BS and MS in Mechanical Engineering, and he has obtained PhD in Mechanical Engineering from Texas A&M. He major in energy system such as HVAC and its heat transfer, optimal design and control of refrigerator, reliability design of mechanical components, and failure Analysis of thermal components in marketplace using the Non-destructive such as SEM & XRAY. Especially, he developed parametric accelerated life testing (ALT) as new reliability methodology. If there is design fault in the mechanical system that is subjected to repetitive stress, it will fail in its lifetime. Engineer should find the design faults by parametric ALT before product launches.

In 1992–1997 he worked in Agency for Defense Development, Chinhae, South Korea, where he has researcher in charge of Development of Naval weapon System. In 2000-2010 he had been working as a Senior Reliability Engineer in Side-by-Side Refrigerator Division, Digital Appliance, SAMSUNG Electronics, where he focused on enhancing the life of refrigerator as using parametric the accelerating life testing. Now he is working as associate professor in mechanical department, Addis Ababa Science & Technology University.