Design and Testability of Diverse Reversible Error Control Circuits

Neeraj Kumar Misra (u. a.)

ISBN 10: 620201508X / ISBN 13: 9786202015080

Published by LAP LAMBERT Academic Publishing, 2017

About this Item

Design and Testability of Diverse Reversible Error Control Circuits | Neeraj Kumar Misra (u. a.) | Taschenbuch | 116 S. | Englisch | 2017 | LAP LAMBERT Academic Publishing | EAN 9786202015080 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.

Seller Inventory # 109712957

Bibliographic Details

• Title: Design and Testability of Diverse Reversible Error Control Circuits
• Publisher: LAP LAMBERT Academic Publishing
• Publication Date: 2017
• Language: English
• ISBN 10: 620201508X
• ISBN 13: 9786202015080
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 8D millimeters 220 millimeters width by 150 millimeters height by 8 millimeters depth
• Weight: 191 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

The authors of this work realized a need for a conservative reversible nanocircuit which can involve quantum computing to researchers and other having a requirement for a cognizance of the emerging field, and the work attempts to meet that need. The book beginnings with a basic to the topic of quantum computing. Followed by one supporting chapters on quantum computing and testing. Nanocircuit design for the low-cost nano-communication framework is addressed in two chapters; one on error control, decoder and the other on testing reversible logic circuit. This leads to another contribution of this work in that synthesis, optimization, testing of reversible circuits, quantum circuit, and logic around quantum-dot cellular automata build through the chapters. A Verilog code describes the algorithm of the HDLQ model components including all elements for the reversible gate is available for the readers. We hope that researchers and instructors find this book useful in their basic learning resource.

About the Author

Neeraj Kumar Misra is Ph.D under TEQIP-II in Institute of Engineering and Technology, Lucknow.Subodh Wairya is Professor and HoD in the Department of Electronics Engineering in Institute of Engineering and Technology, Lucknow.Bibhash Sen is AP in the Department of Computer Science and Engineering in National Institute of Technology, Durgapur, WB.