Designer\ s Guide to Testable ASIC Devices
Wayne M. Needham
ISBN 10: 0442002211 ISBN 13: 9780442002213
Published by Springer US, 1991
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About this Item
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KlappentextWhile making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows reade. Seller Inventory # 458435570
Synopsis:
While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyright Book News, Inc. Portland, Or.
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Bibliographic Details
Title: Designer\ s Guide to Testable ASIC Devices
Publisher: Springer US
Publication Date: 1991
Binding: Gebunden
Condition: New
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Designer's Guide to Testable Asic Devices
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Designer's Guide to Testable ASIC Devices
Published by
Van Nostrand Reinhold Company, 1991
ISBN 10: 0442002211
ISBN 13: 9780442002213
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DESIGNER'S GUIDE TO TESTABLE ASIC DEVICES (HB)
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Designer*s Guide to Testable Asic Devices
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Designer's Guide to Testable A.S.I.C. Devices
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Kluwer Academic Publishers Group, 1991
ISBN 10: 0442002211
ISBN 13: 9780442002213
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Condition: New. While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o Num Pages: 298 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 235 x 155 x 20. Weight in Grams: 607. . 1991. Hardback. . . . . Seller Inventory # V9780442002213
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Designer's Guide to Testable ASIC Devices
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Buch. Condition: Neu. Neuware - While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o. Seller Inventory # 9780442002213
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