Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology Series)

Liam Blunt Ken J. Stout

ISBN 10: 1857180232 / ISBN 13: 9781857180237

Published by Elsevier Science & Technology, 2000

About this Item

Neu new item, well packed; fast shipping; Neuware; Rechnung mit MwSt.; Bestellungen bis 15 Uhr werden am gleichen Werktag verschickt.Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard. Updated version of noted previous publication Contains basis, for the first time, for a unified approach to the subject The basis for a 3D international standard ; 384 pp. Englisch.

Seller Inventory # INF1000351290

Bibliographic Details

• Title: Development of Methods for Characterisation of Roughness in Three Dimensions (Ultra Precision Technology Series)
• Publisher: Elsevier Science & Technology
• Publication Date: 2000
• Language: English
• ISBN 10: 1857180232
• ISBN 13: 9781857180237
• Binding: Taschenbuch
• Condition: Neu
• Weight: 1286 grams

About this title

Synopsis

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

· Updated version of noted previous publication· Contains basis, for the first time, for a unified approach to the subject· The basis for a 3D international standard

About the Author

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).