Development of Methods for Characterisation of Roughness in Three Dimensions: 1ed

Stout, Ken J; Blunt, Liam; Dong, W. P.; Mainsah, E.; Luo, N.; Mathia, T.; Sullivan, P. J.; Zahouani, H.

ISBN 10: 1857180232 / ISBN 13: 9781857180237

Published by Butterworth-Heinemann, 2002

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Bibliographic Details

• Title: Development of Methods for Characterisation of Roughness in Three Dimensions: 1ed
• Publisher: Butterworth-Heinemann
• Publication Date: 2002
• Language: English
• ISBN 10: 1857180232
• ISBN 13: 9781857180237
• Binding: Soft cover
• Condition: Brand New

About this title

Synopsis

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

· Updated version of noted previous publication· Contains basis, for the first time, for a unified approach to the subject· The basis for a 3D international standard

About the Author

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).