Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware
Language: English
Published by Technis, 2000
- Softcover
- Used
Seller: BoundlessBookstore, Wallingford, United KingdomBoundlessBookstore
AbeBooks seller since February 12, 2013
Condition: Used - Good
US$ 4.08
Quantity: 1 available
Add to basketItem description from seller
Signed with gift message. Good condition paperback. Book content is clean and bright. Covers have light wear. There will be no loose pages.
Seller Inventory # 9999-9993500665
Bibliographic details
- Title
- Developments in the Use of Failure Rate Data and Reliability Prediction Methods for Hardware
- Author
- Smith, David John
- Publisher
- Technis
- Publication year
- 2000
- Condition
- Good
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 0951656260
- ISBN 13
- 9780951656266
BoundlessBookstore
Wallingford, United Kingdom
AbeBooks seller since February 12, 2013
Shipping rates from United Kingdom to U.S.A.
| Item | 5 to 15 business days | 5 to 15 business days |
|---|---|---|
| First item | US$ 9.22 | US$ 9.22 |
Payment methods
Seller's business information
WRAP Ltd.
Unit 4, 119 Loverock Rd
Reading, United Kingdom RG30 1DZ
Terms of sale
Customers may return books within 30 days of the original
sale. Please get in touch with any queries/problems, we are
always on hand to help.
Shipping terms
Shipping costs are based on books weighing 2.2 LB, or 1 KG. If your book order is heavy or oversized, we may contact you to let you know extra shipping is required.