Diffuse X-ray scattering is a rich (virtually untapped) source of local structural information over and above that obtained by conventional crystal structure determination (crystallography). The main aim in the book is to show how computer simulation of a model crystal provides a general method by which diffuse scattering of all kinds and from all types of materials can be interpreted and analyzed.

Part I gives a description of the experimental methods used to obtain diffuse scattering data. Part II describes a number of simple stochastic models of disorder, which allows various concepts to be established and enables simple examples to be generated to illustrate key principles. Part III describes example studies of a wide variety of real materials. These examples not only document the development of computer simulation methods for investigating and analyzing disorder problems but also to provide a resource to help future researchers to recognize the kinds of effects that can occur and to point the way to tackling new problems which are encountered.

About the Author

T.R. Welberry received his undergraduate degree at St. John's College Cambridge before obtaining a PhD in Chemical Crystallography at University College London in 1970. He did Post Doctoral research at University College, Cardiff, and from 1975 to the present has been in the Research School of Chemistry at the Australian National University, first at the level of Fellow, then Senior Fellow and now Professor. He was President of SCANZ, The Society of Crystallographers in Australia and New Zealand (2000-2001).

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