Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by John Wiley & Sons, 1993
- Hardcover
- New
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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pp. 196.
Seller Inventory # 26489135
- Title
- Digital Integrated Circuit Testing from a Quality Perspective
- Author
- Eugene R. Hnatek
- Publisher
- John Wiley & Sons
- Publication year
- 1993
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0442006438
- ISBN 13
- 9780442006433
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
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Books Puddle
Woodside, NY, U.S.A.
4-star seller
AbeBooks seller since November 22, 2018
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| Item | 12 to 19 business days | 12 to 14 business days |
|---|---|---|
| First item | US$ 3.99 | US$ 6.99 |
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PLETOS INC
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