Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by John Wiley & Sons, 1993
- Hardcover
- New
Seller: Biblios, frankfurt am main, hessen, GermanyBiblios
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Hardcover
Condition: New
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PRINT ON DEMAND pp. 196.
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- Title
- Digital Integrated Circuit Testing from a Quality Perspective
- Author
- Hnatek Eugene R.
- Publisher
- John Wiley & Sons
- Publication year
- 1993
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0442006438
- ISBN 13
- 9780442006433
Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
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Biblios
frankfurt am main, hessen, Germany
4-star seller
AbeBooks seller since September 10, 2024
Shipping rates from Germany to U.S.A.
| Item | 25 to 45 business days | 8 to 14 business days |
|---|---|---|
| First item | US$ 11.15 | US$ 20.95 |
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