Digital Integrated Circuit Testing from a Quality Perspective

Eugene R. Hnatek

ISBN 10: 0442006438 / ISBN 13: 9780442006433

Published by Springer US, Springer Aug 1993, 1993

About this Item

Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.

Seller Inventory # 9780442006433

Bibliographic Details

• Title: Digital Integrated Circuit Testing from a Quality Perspective
• Publisher: Springer US, Springer Aug 1993
• Publication Date: 1993
• Language: English
• ISBN 10: 0442006438
• ISBN 13: 9780442006433
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 16D millimeters 241 millimeters width by 160 millimeters height by 16 millimeters depth
• Weight: 462 grams

About this title

Synopsis

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a