Digital Systems Testing and Testable Design Abramovici, Miron; Breuer, Melvin A. and Friedman, Arthur D.

Abramovici, Miron; Breuer, Melvin A. and Friedman, Arthur D.

ISBN 10: 0780310624 / ISBN 13: 9780780310629

Published by Wiley-IEEE Press, 1994

About this Item

Seller Inventory # DCBP--0095

Bibliographic Details

Title: Digital Systems Testing and Testable Design ...

Publisher: Wiley-IEEE Press

Publication Date: 1994

Binding: Hardcover

Condition: New

About this title

Synopsis:

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

From the Back Cover:

This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.

Considered a definitive text in this area, the book includes in-depth discussions of the following topics:

Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built-in self-test Diagnosis

All topics are covered extensively, from fundamental concepts to advanced techniques.

Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.