Digital Systems Testing and Testable Design

Abramovici, Miron

ISBN 10: 8172248911 / ISBN 13: 9788172248918

Published by Jaico Publishing House, 2008

About this Item

This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1150grams, ISBN:9788172248918.

Seller Inventory # 9627500

Bibliographic Details

• Title: Digital Systems Testing and Testable Design
• Publisher: Jaico Publishing House
• Publication Date: 2008
• Language: English
• ISBN 10: 8172248911
• ISBN 13: 9788172248918
• Binding: Soft cover
• Condition: Fair
• Weight: 1150 grams
• Seller catalogs:
  • Engineering

About this title

Synopsis

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state–of–the–art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built–in self–test, and diagnosis. Complete with numerous problems, this book is a must–have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

From the Back Cover

This widely–used textbook provides comprehensive, state–of–the–art coverage of digital systems testing and testable design.

Considered a definitive text in this area, the book includes in–depth discussions of the following topics:

Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built–in self–test Diagnosis

All topics are covered extensively, from fundamental concepts to advanced techniques.

Successfully used world–wide at leading universities, the book is appropriate for graduate–level and senior–level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.