Digital Systems Testing & Testable Design
Abramovici, Miron; Breuer, Melvin A.; Friedman, Arthur D.
Language: English
Published by Wiley-IEEE Press (edition 1), 1994
- Hardcover
- Used

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Seller Inventory # 0780310624-7-1
- Title
- Digital Systems Testing & Testable Design
- Author
- Abramovici, Miron; Breuer, Melvin A.; Friedman, Arthur D.
- Publisher
- Wiley-IEEE Press (edition 1)
- Publication year
- 1994
- Condition
- Fair
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0780310624
- ISBN 13
- 9780780310629
- Edition
- 1.
"Synopsis" may belong to another edition of this title.
About the Author
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
"About the title" may belong to another edition of this title.
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