Digital Systems Testing and Testable Design

Friedman, Arthur D., Abramovici, Miron, Breuer, Melvin A.

ISBN 10: 0780310624 / ISBN 13: 9780780310629

Published by Wiley & Sons, Incorporated, John, 1994

Ships from the UK. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects. Seller Inventory # GRP23597993

Synopsis:

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

About the Author:

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.

Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.

Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.

Bibliographic Details

Title: Digital Systems Testing and Testable Design
Publisher: Wiley & Sons, Incorporated, John
Publication Date: 1994
Binding: Hardcover
Condition: Very Good
Edition: rev.