Digital Timing Macromodeling for VLSI Design Verification (Hardcover)

Jeong-Taek Kong

ISBN 10: 0792395808 / ISBN 13: 9780792395805

Published by Kluwer Academic Publishers, Dordrecht, 1995

About this Item

Hardcover. A history of the development of simulation techniques, presenting a detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level and gate-level simulation. The text also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 examines the advantages and disadvantages of the many techniques applied in modern digital macromodels. The book also presents a wide variety of techniques for performing nonlinear macromodelling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address topics such as: the device model detail; transistor coupling capacitance; effective channel length modulation; series transistor reduction; effective transconductance; input terminal dependence; gate parasitic capacitance; the body effect; the impact of parasitic RC-interconnects; and the effect of transmission gates. Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Seller Inventory # 9780792395805

Bibliographic Details

• Title: Digital Timing Macromodeling for VLSI Design Verification (Hardcover)
• Publisher: Kluwer Academic Publishers, Dordrecht
• Publication Date: 1995
• Language: English
• ISBN 10: 0792395808
• ISBN 13: 9780792395805
• Binding: Hardcover
• Condition: new

About this title

Synopsis

Digital Timing Macromodeling for VLSI Design Verification first of all provides an extensive history of the development of simulation techniques. It presents detailed discussion of the various techniques implemented in circuit, timing, fast-timing, switch-level timing, switch-level, and gate-level simulation. It also discusses mixed-mode simulation and interconnection analysis methods. The review in Chapter 2 gives an understanding of the advantages and disadvantages of the many techniques applied in modern digital macromodels.
The book also presents a wide variety of techniques for performing nonlinear macromodeling of digital MOS subcircuits which address a large number of shortcomings in existing digital MOS macromodels. Specifically, the techniques address the device model detail, transistor coupling capacitance, effective channel length modulation, series transistor reduction, effective transconductance, input terminal dependence, gate parasitic capacitance, the body effect, the impact of parasitic RC-interconnects, and the effect of transmission gates. The techniques address major sources of errors in existing macromodeling techniques, which must be addressed if macromodeling is to be accepted in commercial CAD tools by chip designers. The techniques presented in Chapters 4-6 can be implemented in other macromodels, and are demonstrated using the macromodel presented in Chapter 3. The new techniques are validated over an extremely wide range of operating conditions: much wider than has been presented for previous macromodels, thus demonstrating the wide range of applicability of these techniques.