Doneker, J: Defect Recognition and Image Processing in Semic

Language: English

Published by CRC Press, 1998

0750305002 / 9780750305006

  • Hardcover
  • New
See all details

Seller: moluna, Greven, Germanymoluna

5-star seller

AbeBooks seller since July 9, 2020

View this seller's items
Hardcover

Condition: New

US$ 378.27

US$ 56.08 shipping 
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket
Free 30-day returns

Item description from seller

Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Doneker, J.Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This .

Seller Inventory # 594940535

Title
Doneker, J: Defect Recognition and Image Processing in Semic
Author
J. Doneker|I. Rechenberg
Publisher
CRC Press
Publication year
1998
Condition
New
Binding
Gebunden
Language
English
ISBN 10
0750305002
ISBN 13
9780750305006

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First itemUS$ 56.08US$ 56.08
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay
  • Bank Wire Transfer
  • Check
  • Paypal

Store description

Online Handel nur mit Neubüchern

Seller's business information

Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268