The Dopant Density and Temperature Dependence of Electron Mobility and Resistivity in N-Type Silicon (NBS Special Publication 400-33).
Published by National Bureau of Standards., 1977
- Softcover
- Used
Seller: Eryops Books, Stephenville, TX, U.S.A.Eryops Books
AbeBooks seller since July 11, 2003
Condition: Used - Very good
US$ 4.75
Quantity: 1 available
Add to basketItem description from seller
ORIGINAL 1977 PUBLICATION; Softcover; in very good condition.
Seller Inventory # 032168
Bibliographic details
- Title
- The Dopant Density and Temperature Dependence of Electron Mobility and Resistivity in N-Type Silicon (NBS Special Publication 400-33).
- Author
- Sheng, S. Li and the Electronic Technology Division, Institute for Applied Technology, National Bureau of Standards.
- Publisher
- National Bureau of Standards.
- Publication year
- 1977
- Condition
- Very Good
- Book Type
- Book
- Binding
- Soft cover
- Seller catalogs
- Physical Sciences
Eryops Books
Stephenville, TX, U.S.A.
AbeBooks seller since July 11, 2003
Shipping rates within U.S.A.
| Item | 5 to 14 business days | 3 to 6 business days |
|---|---|---|
| First item | US$ 6.00 | US$ 12.00 |
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Store description
Internet and Mail Order bookstore for out of print and rare books in the natural sciences, history and archeology.
Specialty
Paleontology, Archeology, Geology, Zoology, Botany, Natural HistorySeller's business information
Eryops Books
TX, U.S.A.
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