Dynamic Laser Stimulation

Tuba Kiyan

ISBN 10: 3659338621 / ISBN 13: 9783659338625

Published by LAP LAMBERT Academic Publishing Feb 2013, 2013

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -It is assumed that dynamic analysis of ICs will keep on progressing especially due to the increasing clock rates. Operation in higher frequency ranges requires a high-level quality delay testing capability. Dynamic Laser Stimulation techniques allow timing analysis of devices. CMOS devices, like delay chains and scan chains are investigated by DLS techniques. In order to detect very small laser-induced propagation delay variations with high resolution on the delay chains, different experimental setups are built and they are compared considering the acquisition time and signal quality. Moreover, it is demonstrated that the pulsed laser can suppress the laser induced secondary effects in opposition to the continuous wave laser. For the timing analysis of ICs, a new and systematic method is developed, which uses soft fault injection phenomenon on the scan chains. It can identify the most sensitive signal condition to the laser stimulation by using 1064 nm pulsed laser beam. 196 pp. Englisch.

Seller Inventory # 9783659338625

Bibliographic Details

• Title: Dynamic Laser Stimulation
• Publisher: LAP LAMBERT Academic Publishing Feb 2013
• Publication Date: 2013
• Language: English
• ISBN 10: 3659338621
• ISBN 13: 9783659338625
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 12D millimeters 220 millimeters width by 150 millimeters height by 12 millimeters depth
• Weight: 310 grams

About this title

Synopsis

It is assumed that dynamic analysis of ICs will keep on progressing especially due to the increasing clock rates. Operation in higher frequency ranges requires a high-level quality delay testing capability. Dynamic Laser Stimulation techniques allow timing analysis of devices. CMOS devices, like delay chains and scan chains are investigated by DLS techniques. In order to detect very small laser-induced propagation delay variations with high resolution on the delay chains, different experimental setups are built and they are compared considering the acquisition time and signal quality. Moreover, it is demonstrated that the pulsed laser can suppress the laser induced secondary effects in opposition to the continuous wave laser. For the timing analysis of ICs, a new and systematic method is developed, which uses “soft fault injection” phenomenon on the scan chains. It can identify the most sensitive signal condition to the laser stimulation by using 1064 nm pulsed laser beam.

About the Author

Dr. Tuba KIYAN received B.Sc. and M.Sc. degrees in Electronics Engineereing from Yildiz Technical University, Istanbul with focus on semiconductor devices. She had her PhD in Berlin University of Technology in 2010. Currently, she is working as a scientist and lecturer in Yildiz Technical University.