Efficient Electromagnetic Material Characterization via 2-D Rectangular Waveguide Reduction

Dwyer, Derek R

ISBN 10: 1025118065 / ISBN 13: 9781025118062

Published by Hutson Street Press, 2025

About this Item

Seller Inventory # I-9781025118062

Bibliographic Details

• Title: Efficient Electromagnetic Material Characterization via 2-D Rectangular Waveguide Reduction
• Publisher: Hutson Street Press
• Publication Date: 2025
• Language: English
• ISBN 10: 1025118065
• ISBN 13: 9781025118062
• Binding: Soft cover
• Condition: New

About this title

Synopsis

A new, low-frequency, rectangular waveguide-based electromagnetic material characterization technique is developed that will reduce the test sample size in two dimensions realizing up to 50 percent reduction in sample cross-sectional area. To achieve this, custom made, reduced aperture, sample holder flanges were used that reduce the waveguide's excessive cross-sectional dimensions, resulting in reduced sample fabrication costs. Additionally, MatLab code was developed to implement the rigorously derived modal-analysis solution that accommodates induced, higher-order transverse electric and transverse magnetic modes and accurately extract the reduced test sample's constitutive parameters. Experimental results using various test samples are compared to known, full-aperture measurements for both the reduced aperture waveguide configurations to verify the theoretical analysis. A differential error analysis is also performed for each configuration in an attempt to estimate the error associated with test sample thickness, aperture dimensions, and sample placement uncertainties.

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