Electrically Based Microstructural Characterization II : Symposium Held December 1-4, 1997, Boston, Massachusetts, U.S.A

Gerhardt, Rosario A. (EDT); Alim, M. A. (EDT); Taylor, S. Ray (EDT)

ISBN 10: 155899405X / ISBN 13: 9781558994058

Published by Cambridge University Press, 1998

About this Item

Seller Inventory # 12414345-n

Bibliographic Details

• Title: Electrically Based Microstructural Characterization II : Symposium Held December 1-4, 1997, Boston, Massachusetts, U.S.A
• Publisher: Cambridge University Press
• Publication Date: 1998
• Language: English
• ISBN 10: 155899405X
• ISBN 13: 9781558994058
• Binding: Hardcover
• Condition: New

About this title

Synopsis

This book provides a forum for researchers who have been using a variety of electrical measurements as a means to obtain microstructural information about their materials. Microstructure in this context includes features at all length scales - atomic to macroscopic. Even though numerous examples of microstructure/electrical property correlations exist, this book focuses on the myriad of applications that have already been successful. In addition, advances in techniques for the interpretation of data and modelling of materials-related phenomena are emphasized. The effects of percolation and connectivity of electrical paths are of particular interest as they determine the resultant electrical response. These in turn are intimately linked to how a material is processed, what phases it contains, and how the phases are distributed in real space. All classes of materials are covered including semiconductors, electroceramics, biological materials, polymers, metals, geomaterials and a variety of composites. Topics include: advances in localized electrical testing; semiconductor and microelectronic applications; magnetic and polymeric materials; dielectrics and ferroelectrics; varistors; ionic and mixed conductors and composites and percolation systems.

Book Description

This book provides a forum for researchers who have been using a variety of electrical measurements as a means to obtain microstructural information about their materials. Microstructure in this context includes features at all length scales - atomic to macroscopic. Even though numerous examples of microstructure/electrical property correlations exist, this book focuses on the myriad of applications that have already been successful.