Electromagnetic Field Standards and Exposure Systems (Electromagnetics and Radar)
Language: English
Published by Scitech Publishing, 2013
- Hardcover
- Used

Seller: Books From California, Simi Valley, CA, U.S.A.Books From California
AbeBooks seller since August 14, 2001
Condition: Used - Very good
US$ 100.89
Quantity: 1 available
Add to basketSeller Inventory # mon0004202021
- Title
- Electromagnetic Field Standards and Exposure Systems (Electromagnetics and Radar)
- Author
- Trzaska, Hubert, Grudzinski, Eugeniusz
- Publisher
- Scitech Publishing
- Publication year
- 2013
- Condition
- Very Good
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 161353177X
- ISBN 13
- 9781613531778
While it provides a review of fundamental properties of electromagnetic fields and the simple antennas that can generate and receive such fields, the main focus of this book is dedicated to the analysis of the accuracy of measurements and field standards using a range of radiating structures. It is designed to help develop the following measurement standards: proper calibration of the measuring instrument, external environmental factors that affect accuracy and competence and training of the instrument operator. As such, it is ideal for practicing engineers in the field of antennas, electromagnetic compatibility and electromagnetic propagation who are concerned with measurement techniques.
This is a companion book to Electromagnetic Measurements of the Near Field.
"Synopsis" may belong to another edition of this title.
About the Author
Dr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Standards and Measurements Lab and Lecturer at the University. Dr. Grudzinski is the author of many publications in the field of EMF metrology. His book on EMF standards and measurements was originally published in Polish to immediate success.
Prof. Hubert Trzaska born in 1939 in Wilno, Poland (presently Vilnius, Lithuania). He is Head of the EM Environment Protection Lab at the University of Wroclaw, devoting his research to the practical aspects of EMF metrology. He holds over 70 patents in the field of EMF measurements and standards. He is the author of Electromagnetic Measurements in the Near Field, Second Edition (SciTech-IET).
"About the title" may belong to another edition of this title.
Books From California
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