Electromagnetic Field Standards and Exposure Systems

Grudzinski, Eugeniusz; Trzaska, Hubert

ISBN 10: 161353177X / ISBN 13: 9781613531778

Published by Scitech Publishing, 2013

About this Item

Unread book in perfect condition.

Seller Inventory # 20083738

Bibliographic Details

• Title: Electromagnetic Field Standards and Exposure Systems
• Publisher: Scitech Publishing
• Publication Date: 2013
• Language: English
• ISBN 10: 161353177X
• ISBN 13: 9781613531778
• Binding: Hardcover
• Condition: As New

About this title

Synopsis

This book addresses the need to establish measurement standards for electromagnetic fields to produce accurate results and is ideal for engineers concerned with measurement techniques.

While it provides a review of fundamental properties of electromagnetic fields and the simple antennas that can generate and receive such fields, the main focus of this book is dedicated to the analysis of the accuracy of measurements and field standards using a range of radiating structures. It is designed to help develop the following measurement standards: proper calibration of the measuring instrument, external environmental factors that affect accuracy and competence and training of the instrument operator. As such, it is ideal for practicing engineers in the field of antennas, electromagnetic compatibility and electromagnetic propagation who are concerned with measurement techniques.

This is a companion book to Electromagnetic Measurements of the Near Field.

About the Authors

Dr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Standards and Measurements Lab and Lecturer at the University. Dr. Grudzinski is the author of many publications in the field of EMF metrology. His book on EMF standards and measurements was originally published in Polish to immediate success.

Prof. Hubert Trzaska born in 1939 in Wilno, Poland (presently Vilnius, Lithuania). He is Head of the EM Environment Protection Lab at the University of Wroclaw, devoting his research to the practical aspects of EMF metrology. He holds over 70 patents in the field of EMF measurements and standards. He is the author of Electromagnetic Measurements in the Near Field, Second Edition (SciTech-IET).