Electromigration and Electronic Device Degradation
Language: English
Published by Wiley-Interscience, 1993
- Hardcover
- New

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- Title
- Electromigration and Electronic Device Degradation
- Publisher
- Wiley-Interscience
- Publication year
- 1993
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0471584894
- ISBN 13
- 9780471584896
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
"Synopsis" may belong to another edition of this title.
About the Author
Aris Christou is the author of Electromigration and Electronic Device Degradation, published by Wiley.
"About the title" may belong to another edition of this title.
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