Title: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
Publisher: Marcel Dekker Inc
Publication Date: 1991
Language: English
ISBN 10: 0824785568
ISBN 13: 9780824785567
Binding: Hardcover
Edition: 2nd Edition
Condition: Brand New
Weight: 1.6 kilograms

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Synopsis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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Lawrence E. Murr

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