Title: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, (Optical Science and Engineering)
Publisher: CRC Press
Publication Date: 2019
Language: English
ISBN 10: 0367402947
ISBN 13: 9780367402945
Binding: Paperback
Edition: 2nd Edition
Condition: New
Book Type: book

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Synopsis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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Lawrence E. Murr

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