Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)
Language: English
Published by CRC Press, 2019
- Softcover
- New
Seller: Biblios, frankfurt am main, hessen, GermanyBiblios
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Softcover
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pp. 856.
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- Title
- Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)
- Publisher
- CRC Press
- Publication year
- 2019
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 0367402947
- ISBN 13
- 9780367402945
- Edition
- 2nd Edition
- Series
- Book 77 of 98: Optical Science and Engineering
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
"Synopsis" may belong to another edition of this title.
About the Author
Lawrence E. Murr
"About the title" may belong to another edition of this title.
Biblios
frankfurt am main, hessen, Germany
4-star seller
AbeBooks seller since September 10, 2024
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