Title: Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)
Publisher: CRC Press
Publication Date: 2019
Language: English
ISBN 10: 0367402947
ISBN 13: 9780367402945
Binding: Soft cover
Edition: 2nd Edition
Condition: New

About this title

Synopsis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

About the Author

Lawrence E. Murr

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