Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)
Language: English
Published by CRC Press, 2019
- Softcover
- New
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Softcover
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pp. 856.
Seller Inventory # 384690990
- Title
- Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,: 29 (Optical Science and Engineering)
- Publisher
- CRC Press
- Publication year
- 2019
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 0367402947
- ISBN 13
- 9780367402945
- Edition
- 2nd Edition
- Series
- Book 77 of 98: Optical Science and Engineering
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
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About the Author
Lawrence E. Murr
"About the title" may belong to another edition of this title.
Majestic Books
Hounslow, United Kingdom
4-star seller
AbeBooks seller since January 19, 2007
Shipping rates from United Kingdom to U.S.A.
| Item | 14 to 45 business days | 5 to 10 business days |
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| First item | US$ 8.60 | US$ 13.04 |
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