Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

S. J. B. Reed

ISBN 10: 052184875X / ISBN 13: 9780521848756

Published by Cambridge Univ Pr, 2005

About this Item

2nd edition. 189 pages. 10.00x7.25x0.50 inches. In Stock.

Seller Inventory # x-052184875X

Bibliographic Details

• Title: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
• Publisher: Cambridge Univ Pr
• Publication Date: 2005
• Language: English
• ISBN 10: 052184875X
• ISBN 13: 9780521848756
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: Brand New
• Weight: 0.62 kilograms

About this title

Synopsis

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Book Description

This 2005 book forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories. Throughout the book there is an emphasis on geological aspects and unnecessary technical detail is avoided in order to make the book easily accessible.