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Bibliographic Details

Title: Electron and ion microscopy and microanalysis: Principles and applications (Optical engineering)
Publisher: Marcel Dekker
Publication Date: 1982
Language: English
ISBN 10: 0824715535
ISBN 13: 9780824715533
Binding: hardcover
Condition: Very Good

About this title

Synopsis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

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