Electronic Design Automation for Ic System Design, Verification, and Testing

ISBN 10: 148225462X / ISBN 13: 9781482254624

Published by CRC Press, 2016

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Bibliographic Details

• Title: Electronic Design Automation for Ic System Design, Verification, and Testing
• Publisher: CRC Press
• Publication Date: 2016
• Language: English
• ISBN 10: 148225462X
• ISBN 13: 9781482254624
• Binding: Hardcover
• Edition: 2nd Edition
• Condition: Like New
• Book Type: book

About this title

Synopsis

The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more.

New to This Edition:

• Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs
• Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography
• New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition―these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models

Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.

About the Author

Luciano Lavagno, Igor L. Markov, Grant Martin, Louis K. Scheffer