Electronics and Communication Engineering Series: semiconductor physics test(Chinese Edition)

Paperback. Pub 2012 08 152 Chinese in Harbin Institute of Technology Electronics and Communication Engineering semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly the basic nature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semiconductor. the impurity concentration and its distribution of the measurement technique; carrier oscillator in the law of motion under the electric field. and the Hall coefficient and conductivity measurement methods; law of motion of non-equilibrium carriers and their generation and recombination mechanisms. minority carrier lifetime measurement; pn junction formation process its electr...