Electronics and Communication Engineering Series: semiconductor physics test(Chinese Edition)

TAN CHANG LONG WU FENG MIN WANG ZHEN HUA

ISBN 10: 7560336485 / ISBN 13: 9787560336480

Published by Harbin Institute of Technology Press, 2000

About this Item

Paperback. Pub Date: 2012 08 Pages: 152 Language: Chinese in Publisher: Harbin Institute of Technology Electronics and Communication Engineering Series: semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly includes: the basic nature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semi.

Seller Inventory # CD016326

Bibliographic Details

• Title: Electronics and Communication Engineering Series: semiconductor physics test(Chinese Edition)
• Publisher: Harbin Institute of Technology Press
• Publication Date: 2000
• Language: Chinese
• ISBN 10: 7560336485
• ISBN 13: 9787560336480
• Binding: paperback
• Condition: New

About this title

Synopsis

Paperback. Pub 2012 08 152 Chinese in Harbin Institute of Technology Electronics and Communication Engineering semiconductor physics test analysis more comprehensive introduction to the basics of semiconductor physics test analysis. Mainly the basic nature of the semiconductor; semiconductor impurity and defect levels. and silicon dislocations and stacking fault observed; statistical distribution of the carriers in the equilibrium state semiconductor. the impurity concentration and its distribution of the measurement technique; carrier oscillator in the law of motion under the electric field. and the Hall coefficient and conductivity measurement methods; law of motion of non-equilibrium carriers and their generation and recombination mechanisms. minority carrier lifetime measurement; pn junction formation process its electr...