Embedded Memory Design for Multi-Core and Systems on Chip (Analog Circuits and Signal Processing, 116)

Mohammad, Baker

ISBN 10: 1493948016 / ISBN 13: 9781493948017

Published by Springer, 2016

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Seller Inventory # ERICA77314939480166

Bibliographic Details

• Title: Embedded Memory Design for Multi-Core and Systems on Chip (Analog Circuits and Signal Processing, 116)
• Publisher: Springer
• Publication Date: 2016
• Language: English
• ISBN 10: 1493948016
• ISBN 13: 9781493948017
• Binding: Paperback
• Condition: Like New
• Book Type: book

About this title

Synopsis

This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.

From the Back Cover

This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.

· Provides a comprehensive overview of embedded memory design and associated challenges and choices;

· Explains tradeoffs and dependencies across different disciplines involved with multi-core and system on chip memory design;

· Includes detailed discussion of memory hierarchy and its impact on energy and performance;

· Uses real product examples to demonstrate embedded memory design flow from architecture, to circuit design, design for test and yield analysis.