Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
Language: English
Published by Springer, 2007
- Softcover
- New
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
AbeBooks seller since January 6, 2003
Condition: New
US$ 273.30
Quantity: 2 available
Add to basketItem description from seller
420 pages. 9.09x6.10x0.98 inches. In Stock.
Seller Inventory # x-144194513X
- Title
- Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
- Author
- Tehranipoor, Mohammad (Editor)
- Publisher
- Springer
- Publication year
- 2007
- Condition
- Brand New
- Binding
- Paperback
- Language
- English
- ISBN 10
- 144194513X
- ISBN 13
- 9781441945136
- Item weight
- 0.64 kilograms
- Series
- Book 19 of 40: Frontiers in Electronic Testing
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
"Synopsis" may belong to another edition of this title.
From the Back Cover
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
"About the title" may belong to another edition of this title.
Revaluation Books
Exeter, United Kingdom
AbeBooks seller since January 6, 2003
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Edward Bowditch Ltd
Exstowe, Exton
Exeter, United Kingdom EX3 0PP
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