Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37)
Language: English
Published by Springer, 2007
- Hardcover
- New

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- Title
- Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37)
- Publisher
- Springer
- Publication year
- 2007
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 038774746X
- ISBN 13
- 9780387747460
- Item weight
- 889 grams
- Series
- Book 19 of 40: Frontiers in Electronic Testing
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
"Synopsis" may belong to another edition of this title.
From the Back Cover
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
"About the title" may belong to another edition of this title.
Ria Christie Collections
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