Energy Efficient Fault-Tolerant Systems

Mathew, Jimson

ISBN 10: 1461441927 / ISBN 13: 9781461441922

Published by Springer-Verlag New York Inc., 2013

About this Item

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Editor(s): Mathew, Jimson; Shafik, Rishad A.; Pradhan, Dhiraj K. Series: Embedded Systems. Num Pages: 349 pages, 81 black & white illustrations, 51 colour illustrations, 41 black & white tables, biograp. BIC Classification: TH; TJFC; UKM. Category: (P) Professional & Vocational. Dimension: 236 x 163 x 24. Weight in Grams: 698. . 2013. 2014th Edition. Hardcover. . . . .

Seller Inventory # V9781461441922

Bibliographic Details

• Title: Energy Efficient Fault-Tolerant Systems
• Publisher: Springer-Verlag New York Inc.
• Publication Date: 2013
• Language: English
• ISBN 10: 1461441927
• ISBN 13: 9781461441922
• Binding: Hardcover
• Condition: New

About this title

Synopsis

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

From the Back Cover

This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.

· Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability;

· Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches;

· Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.