Evaluation of a A/D Converter Parameter using Histogram Test Technique | With effect of different error analyzed by simulation to meet practical conditions for today's digital world
Manish Jain
ISBN 10: 6200117632 ISBN 13: 9786200117632
Published by LAP LAMBERT Academic Publishing, 2019
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Evaluation of a A/D Converter Parameter using Histogram Test Technique | With effect of different error analyzed by simulation to meet practical conditions for today's digital world | Manish Jain | Taschenbuch | 80 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9786200117632 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu. Seller Inventory # 116925511
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ADC testing is an important activity which plays main role in deciding accuracy of a system. Many applications observe measurement using ADC. Such application entails high accuracy and resolution, thus it is provided by signal’s dynamic range. The values of ADC parameters can be improved in future by increasing the number of samples, frequency and overdrive. the test algorithm can be applied to real time ADC experimental analysis. Modified code density algorithm that reduces the effect of errors on the histogram data. This algorithm can achieve the same level of accuracy as that of the conventional code-density algorithm but using a significantly smaller number of samples, which means shorter test time and lower test cost. The new method is very efficient and can be used to enable testing of high-resolution ADCs with better coverage and reduce the time and cost of testing medium-resolution ADCs. Sophisticated test instruments required for testing high resolution and high speed ADCs are expensive and bigger in size. Therefore the test methodology followed for new methods of testing is to simulate ADC transfer function with software using sine wave as stimuli inputs.
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Title: Evaluation of a A/D Converter Parameter ...
Publisher: LAP LAMBERT Academic Publishing
Publication Date: 2019
Binding: Taschenbuch
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Evaluation of a A/D Converter Parameter using Histogram Test Technique
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ISBN 10: 6200117632
ISBN 13: 9786200117632
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jain Dr. ManishDr. MANISH JAIN Associate Professor, EEE Department, Mandsaur University, Mandsaur (M.P.) obtained PhD in 2015 in ECE. He has published more than 30 papers in International journal and listed in IEEE conference Procee. Seller Inventory # 300309521
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Evaluation of a A/D Converter Parameter using Histogram Test Technique
Published by
LAP LAMBERT Academic Publishing Jun 2019, 2019
ISBN 10: 6200117632
ISBN 13: 9786200117632
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -ADC testing is an important activity which plays main role in deciding accuracy of a system. Many applications observe measurement using ADC. Such application entails high accuracy and resolution, thus it is provided by signal's dynamic range. The values of ADC parameters can be improved in future by increasing the number of samples, frequency and overdrive. the test algorithm can be applied to real time ADC experimental analysis. Modified code density algorithm that reduces the effect of errors on the histogram data. This algorithm can achieve the same level of accuracy as that of the conventional code-density algorithm but using a significantly smaller number of samples, which means shorter test time and lower test cost. The new method is very efficient and can be used to enable testing of high-resolution ADCs with better coverage and reduce the time and cost of testing medium-resolution ADCs. Sophisticated test instruments required for testing high resolution and high speed ADCs are expensive and bigger in size. Therefore the test methodology followed for new methods of testing is to simulate ADC transfer function with software using sine wave as stimuli inputs. 80 pp. Englisch. Seller Inventory # 9786200117632
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Evaluation of a A/D Converter Parameter using Histogram Test Technique
Published by
LAP LAMBERT Academic Publishing Jun 2019, 2019
ISBN 10: 6200117632
ISBN 13: 9786200117632
New
Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Taschenbuch. Condition: Neu. Neuware -ADC testing is an important activity which plays main role in deciding accuracy of a system. Many applications observe measurement using ADC. Such application entails high accuracy and resolution, thus it is provided by signal¿s dynamic range. The values of ADC parameters can be improved in future by increasing the number of samples, frequency and overdrive. the test algorithm can be applied to real time ADC experimental analysis. Modified code density algorithm that reduces the effect of errors on the histogram data. This algorithm can achieve the same level of accuracy as that of the conventional code-density algorithm but using a significantly smaller number of samples, which means shorter test time and lower test cost. The new method is very efficient and can be used to enable testing of high-resolution ADCs with better coverage and reduce the time and cost of testing medium-resolution ADCs. Sophisticated test instruments required for testing high resolution and high speed ADCs are expensive and bigger in size. Therefore the test methodology followed for new methods of testing is to simulate ADC transfer function with software using sine wave as stimuli inputs.Books on Demand GmbH, Überseering 33, 22297 Hamburg 80 pp. Englisch. Seller Inventory # 9786200117632
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Evaluation of a A/D Converter Parameter using Histogram Test Technique : With effect of different error analyzed by simulation to meet practical conditions for today's digital world
Published by
LAP LAMBERT Academic Publishing, 2019
ISBN 10: 6200117632
ISBN 13: 9786200117632
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - ADC testing is an important activity which plays main role in deciding accuracy of a system. Many applications observe measurement using ADC. Such application entails high accuracy and resolution, thus it is provided by signal's dynamic range. The values of ADC parameters can be improved in future by increasing the number of samples, frequency and overdrive. the test algorithm can be applied to real time ADC experimental analysis. Modified code density algorithm that reduces the effect of errors on the histogram data. This algorithm can achieve the same level of accuracy as that of the conventional code-density algorithm but using a significantly smaller number of samples, which means shorter test time and lower test cost. The new method is very efficient and can be used to enable testing of high-resolution ADCs with better coverage and reduce the time and cost of testing medium-resolution ADCs. Sophisticated test instruments required for testing high resolution and high speed ADCs are expensive and bigger in size. Therefore the test methodology followed for new methods of testing is to simulate ADC transfer function with software using sine wave as stimuli inputs. Seller Inventory # 9786200117632