Exploiting Similarity Patterns : To Build Generic Test Case Templates for Software Product Line Testing

Suriya Priya R Asaithambi

ISBN 10: 3330016841 / ISBN 13: 9783330016842

Published by LAP LAMBERT Academic Publishing, 2019

About this Item

nach der Bestellung gedruckt Neuware - Printed after ordering - Software product line testing (SPLT) is more complicated than the conventional testing. Since software product lines consist of several product variants, there arises a need to test each variant thereby causing test case explosion. In this book we studied Android OS product line test libraries to understand the combinatorial test explosion problem. Our study reveals frequent occurrences of test code fragments which we call 'test clones'. As new product variants are added to SPL, test cases from existing products are copied and modified. This leads to test clones and problems of managing large test libraries with many redundancies. In this book, we propose a method to avoid test clones and therefore save effort of developing and maintaining SPL test libraries.

Seller Inventory # 9783330016842

Bibliographic Details

• Title: Exploiting Similarity Patterns : To Build Generic Test Case Templates for Software Product Line Testing
• Publisher: LAP LAMBERT Academic Publishing
• Publication Date: 2019
• Language: English
• ISBN 10: 3330016841
• ISBN 13: 9783330016842
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 16D millimeters 220 millimeters width by 150 millimeters height by 16 millimeters depth
• Weight: 405 grams

About this title

Synopsis

Software product line testing (SPLT) is more complicated than the conventional testing. Since software product lines consist of several product variants, there arises a need to test each variant thereby causing test case explosion. In this book we studied Android OS product line test libraries to understand the combinatorial test explosion problem. Our study reveals frequent occurrences of test code fragments which we call “test clones”. As new product variants are added to SPL, test cases from existing products are copied and modified. This leads to test clones and problems of managing large test libraries with many redundancies. In this book, we propose a method to avoid test clones and therefore save effort of developing and maintaining SPL test libraries.