Title: Exponential Fatigue Life Model for Single-Edge-Notched Beams: An Analytical Approach to Structural Integrity and Fracture Behaviour
Publisher: LAP LAMBERT Academic Publishing
Publication Date: 2025
Language: English
ISBN 10: 6209272835
ISBN 13: 9786209272837
Binding: Soft cover
Condition: New

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Synopsis

This book presents a comprehensive and practical exploration of fatigue crack propagation in single-edge-notched (SEN) beams through the application of an exponential modelling framework. Designed for researchers, engineers, and advanced students, it bridges fundamental fracture mechanics with modern predictive methodologies for evaluating fatigue life. The text offers clear theoretical insights, validated analytical models, and illustrative case studies that demonstrate the accuracy and usefulness of exponential crack growth laws in structural assessment. By combining scientific rigor with accessible explanations, this book equips readers with the knowledge and tools needed to predict fatigue behaviour more reliably, enhance material integrity, and support safer, more efficient engineering designs.

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