Exponential Fatigue Life Model for Single-Edge-Notched Beams
Language: English
Published by LAP LAMBERT Academic Publishing, 2025
- Softcover
- New

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- Title
- Exponential Fatigue Life Model for Single-Edge-Notched Beams
- Author
- Baliarsingh, Avaya Kumar; Rath, Debabrata
- Publisher
- LAP LAMBERT Academic Publishing
- Publication year
- 2025
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 6209272835
- ISBN 13
- 9786209272837
This book presents a comprehensive and practical exploration of fatigue crack propagation in single-edge-notched (SEN) beams through the application of an exponential modelling framework. Designed for researchers, engineers, and advanced students, it bridges fundamental fracture mechanics with modern predictive methodologies for evaluating fatigue life. The text offers clear theoretical insights, validated analytical models, and illustrative case studies that demonstrate the accuracy and usefulness of exponential crack growth laws in structural assessment. By combining scientific rigor with accessible explanations, this book equips readers with the knowledge and tools needed to predict fatigue behaviour more reliably, enhance material integrity, and support safer, more efficient engineering designs.
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Books Puddle
Woodside, NY, U.S.A.
4-star seller
AbeBooks seller since November 22, 2018
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