Extreme Statistics in Nanoscale Memory Design

Language: English

Published by Springer Us, 2010

1441966056 / 9781441966056

Series: Book 24 of 34 - Integrated Circuits and Systems

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Druck auf Anfrage Neuware - Printed after ordering - Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.

Seller Inventory # 9781441966056

Title
Extreme Statistics in Nanoscale Memory Design
Author
Amith Singhee
Publisher
Springer Us
Publication year
2010
Condition
Neu
Binding
Buch
Language
English
ISBN 10
1441966056
ISBN 13
9781441966056
Item weight
531 grams
Dimensions
242x164x27 mm
Series
Book 24 of 34: Integrated Circuits and Systems

AHA-BUCH GmbH

Einbeck, Germany

5-star seller

AbeBooks seller since August 14, 2006

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