Failure Analysis: High Technology Devices (De Gruyter STEM)
Language: English
Published by De Gruyter, 2022
- Softcover
- New

Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
AbeBooks seller since November 22, 2018
Condition: New
US$ 128.28
Quantity: 3 available
Add to basketItem description from seller
1st edition NO-PA16APR2015-KAP.
Seller Inventory # 26396145825
- Title
- Failure Analysis: High Technology Devices (De Gruyter STEM)
- Author
- Sullivan, Daniel J. D.; Carleton, Eric J.
- Publisher
- De Gruyter
- Publication year
- 2022
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 150152478X
- ISBN 13
- 9781501524783
- Series
- Book 163 of 256: De Gruyter STEM
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
"Synopsis" may belong to another edition of this title.
About the Author
Dr. Daniel J. D. Sullivan
attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, “Don’t Date Crazy” by DJDS, and published a board game called Infection.
Dr. Eric J. Carleton
is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.
"About the title" may belong to another edition of this title.
Books Puddle
Woodside, NY, U.S.A.
AbeBooks seller since November 22, 2018
Shipping rates within U.S.A.
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