Failure Analysis of Integrated Circuits

Language: English

Published by Springer US Jan 1999, 1999

0412145618 / 9780412145612

Series: Book 195 of 260 - The Springer International Series in Engineering and Computer Science

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Item description from seller

This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 276 pp. Englisch.

Seller Inventory # 9780412145612

Title
Failure Analysis of Integrated Circuits
Author
Lawrence C. Wagner
Publisher
Springer US Jan 1999
Publication year
1999
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0412145618
ISBN 13
9780412145612
Item weight
582 grams
Dimensions
241x160x20 mm
Series
Book 195 of 260: The Springer International Series in Engineering and Computer Science

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First itemUS$ 25.89US$ 25.89
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BuchWeltWeit Ludwig Meier e.K.

Germany