Failure Analysis of Integrated Circuits

Language: English

Published by Springer US Nov 2012, 2012

1461372313 / 9781461372318

Series: Book 195 of 260 - The Springer International Series in Engineering and Computer Science

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch.

Seller Inventory # 9781461372318

Title
Failure Analysis of Integrated Circuits
Author
Lawrence C. Wagner
Publisher
Springer US Nov 2012
Publication year
2012
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1461372313
ISBN 13
9781461372318
Item weight
417 grams
Dimensions
235x155x15 mm
Series
Book 195 of 260: The Springer International Series in Engineering and Computer Science

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First itemUS$ 25.89US$ 25.89
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BuchWeltWeit Ludwig Meier e.K.

Germany