Failure Analysis of Integrated Circuits

Lawrence C. Wagner

ISBN 10: 1461372313 / ISBN 13: 9781461372318

Published by Springer, Springer Nov 2012, 2012

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 272 pp. Englisch.

Seller Inventory # 9781461372318

Bibliographic Details

• Title: Failure Analysis of Integrated Circuits
• Publisher: Springer, Springer Nov 2012
• Publication Date: 2012
• Language: English
• ISBN 10: 1461372313
• ISBN 13: 9781461372318
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 15D millimeters 235 millimeters width by 155 millimeters height by 15 millimeters depth
• Weight: 417 grams

About this title

Synopsis

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique.
Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.