Failure Analysis of Integrated Circuits

Language: English

Published by Springer US, 2012

1461372313 / 9781461372318

Series: Book 195 of 260 - The Springer International Series in Engineering and Computer Science

  • Softcover
  • New
See all details

Seller: moluna, Greven, Germanymoluna

5-star seller

AbeBooks seller since July 9, 2020

Softcover

Condition: New

US$ 157.83

US$ 55.14 shipping 
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket
Free 30-day returns

Item description from seller

Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.

Seller Inventory # 4195376

Title
Failure Analysis of Integrated Circuits
Author
Wagner, Lawrence C.
Publisher
Springer US
Publication year
2012
Condition
New
Binding
Soft cover
Language
English
ISBN 10
1461372313
ISBN 13
9781461372318
Series
Book 195 of 260: The Springer International Series in Engineering and Computer Science

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First itemUS$ 55.14US$ 55.14
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay
  • Bank Wire Transfer
  • Check
  • Paypal

Store description

Online Handel nur mit Neubüchern

Seller's business information

Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268