Fatigue Testing and Analysis

Lee, Yung-Li/ Pan, Jwo/ Hathaway, Richard/ Barkey, Mark

ISBN 10: 1493302981 ISBN 13: 9781493302987
Published by Butterworth-Heinemann, 2004
Language: English
Condition: New Soft cover

Sold by Revaluation Books, Exeter, United Kingdom

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New - Soft cover

Condition: New

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