Fault Covering Problems in Reconfigurable VLSI Systems

Ran Libeskind-Hadas, Nany Hasan, C. L. Liu, Philip McKinley, Jingsheng Jason Cong

ISBN 10: 0792392310 / ISBN 13: 9780792392316

Published by Springer US, 1992

About this Item

Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Fault Covering Problems in Reconfigurable VLSI Systems describes the authors' recent research on reconfiguration problems for fault-tolerance in VLSI and WSI Systems. The book examines solutions to a number of reconfiguration problems. Efficient algorithms are given for tractable covering problems and general techniques are given for dealing with a large number of intractable covering problems. The book begins with an investigation of algorithms for the reconfiguration of large redundant memories. Next, a number of more general covering problems are considered and the complexity of these problems is analyzed. Finally, a general and uniform approach is proposed for solving a wide class of covering problems. The results and techniques described here will be useful to researchers and students working in this area. As such, the book serves as an excellent reference and may be used as the text for an advanced course on the topic.

Seller Inventory # 3017969/202

Bibliographic Details

• Title: Fault Covering Problems in Reconfigurable VLSI Systems
• Publisher: Springer US
• Publication Date: 1992
• Language: English
• ISBN 10: 0792392310
• ISBN 13: 9780792392316
• Binding: Hardcover
• Condition: Sehr gut
• Seller catalogs:
  • Bücher

About this title

Synopsis

Fault Covering Problems in Reconfigurable VLSI Systems describes the authors' recent research on reconfiguration problems for fault-tolerance in VLSI and WSI Systems. The book examines solutions to a number of reconfiguration problems.
Efficient algorithms are given for tractable covering problems and general techniques are given for dealing with a large number of intractable covering problems.
The book begins with an investigation of algorithms for the reconfiguration of large redundant memories. Next, a number of more general covering problems are considered and the complexity of these problems is analyzed. Finally, a general and uniform approach is proposed for solving a wide class of covering problems.
The results and techniques described here will be useful to researchers and students working in this area. As such, the book serves as an excellent reference and may be used as the text for an advanced course on the topic.