Forces in Scanning Probe Methods

H. -J. Güntherodt

ISBN 10: 9401040273 / ISBN 13: 9789401040273

Published by Springer Netherlands, Springer Netherlands Okt 2012, 2012

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -This volume contains the proceedin,r. of the NATO Advanced Study Institute on 'Forces in Scanning Probe Methods which was CG-sponsered and organized by the 'Forum fUr N anowissenschaften'. The conference was held in Schluchsee in the south em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 660 pp. Englisch.

Seller Inventory # 9789401040273

Bibliographic Details

• Title: Forces in Scanning Probe Methods
• Publisher: Springer Netherlands, Springer Netherlands Okt 2012
• Publication Date: 2012
• Language: English
• ISBN 10: 9401040273
• ISBN 13: 9789401040273
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 240W x 160H x 36D millimeters 240 millimeters width by 160 millimeters height by 36 millimeters depth
• Weight: 1037 grams

About this title

Synopsis

This volume contains the proceedin, r. of the NATO Advanced Study Institute on "Forces in Scanning Probe Methods which was CG-sponsered and organized by the "Forum fUr N anowissenschaften." The conference was held in Schluchsee in the south em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively."