Formal Equivalence Checking and Design Debugging
Language: English
Published by Kluwer Academic Publishers, 1998
- Hardcover
- New

Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
AbeBooks seller since October 9, 2009
Condition: New
US$ 328.91
Quantity: 15 available
Add to basketItem description from seller
Covers the topics of logic equivalence checking and design debugging in design verification. This book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. It also gives a survey of the literature on design error diagnosis and design error correction. Series: Frontiers in Electronic Testing. Num Pages: 247 pages, biography. BIC Classification: UM. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 15. Weight in Grams: 1170. . 1998. Hardback. . . . . Books ship from the US and Ireland.
Seller Inventory # V9780792381846
- Title
- Formal Equivalence Checking and Design Debugging
- Author
- Huan, Shi-Yu; Cheng, Kwang-Ting
- Publisher
- Kluwer Academic Publishers
- Publication year
- 1998
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 079238184X
- ISBN 13
- 9780792381846
- Series
- Book 30 of 40: Frontiers in Electronic Testing
The second part of the book gives a thorough survey of previous and recent literature on design error diagnosis and design error correction. This part also provides an in-depth analysis of the algorithms used in two logic debugging software programs, ErrorTracer and AutoFix, developed by the authors.
From the Foreword:
`With the adoption of the static sign-off approach to verifying circuit implementations the application-specific integrated circuit (ASIC) industry will experience the first radical methodological revolution since the adoption of logic synthesis. Equivalence checking is one of the two critical elements of this methodological revolution. This book is timely for either the designer seeking to better understand the mechanics of equivalence checking or for the CAD researcher who wishes to investigate well-motivated research problems such as equivalence checking of retimed designs or error diagnosis in sequential circuits.'
Kurt Keutzer, University of California, Berkeley
"Synopsis" may belong to another edition of this title.
Kennys Bookstore
Olney, MD, U.S.A.
AbeBooks seller since October 9, 2009
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