Fundamentals of Sum-Frequency Spectroscopy

Y. R. Shen

ISBN 10: 110709884X / ISBN 13: 9781107098848

Published by Cambridge University Press, 2016

About this Item

Druck auf Anfrage Neuware - Printed after ordering - The first book on the topic, and written by the founder of the technique, this comprehensive resource provides a detailed overview of sum-frequency spectroscopy, its fundamental principles, and the wide range of applications for surfaces, interfaces, and bulk. Beginning with an overview of the historical context, and introductions to the basic theory of nonlinear optics and surface sum-frequency generation, topics covered include discussion of different experimental arrangements adopted by researchers, notes on proper data analysis, an up-to-date survey commenting on the wide range of successful applications of the tool, and a valuable insight into current unsolved problems and potential areas to be explored in the future. With the addition of chapter appendices that offer the opportunity for more in-depth theoretical discussion, this is an essential resource that integrates all aspects of the subject and is ideal for anyone using, or interested in using, sum-frequency spectroscopy.

Seller Inventory # 9781107098848

Bibliographic Details

• Title: Fundamentals of Sum-Frequency Spectroscopy
• Publisher: Cambridge University Press
• Publication Date: 2016
• Language: English
• ISBN 10: 110709884X
• ISBN 13: 9781107098848
• Binding: Buch
• Condition: Neu
• Dimensions: 250W x 175H x 23D millimeters 250 millimeters width by 175 millimeters height by 23 millimeters depth
• Weight: 757 grams

About this title

Synopsis

The first book on the topic, and written by the founder of the technique, this comprehensive resource provides a detailed overview of sum-frequency spectroscopy, its fundamental principles, and the wide range of applications for surfaces, interfaces, and bulk. Beginning with an overview of the historical context, and introductions to the basic theory of nonlinear optics and surface sum-frequency generation, topics covered include discussion of different experimental arrangements adopted by researchers, notes on proper data analysis, an up-to-date survey commenting on the wide range of successful applications of the tool, and a valuable insight into current unsolved problems and potential areas to be explored in the future. With the addition of chapter appendices that offer the opportunity for more in-depth theoretical discussion, this is an essential resource that integrates all aspects of the subject and is ideal for anyone using, or interested in using, sum-frequency spectroscopy.

About the Author

Yeun-Ron Shen is responsible for the development of second harmonic and sum-frequency generation spectroscopy into viable tools for surface and interface studies. He has been on the faculty of the physics department of the University of California, Berkeley, since 1964 and has received many awards, including the Charles Hard Townes Award from the OSA, the Arthur L. Schawlow Prize and the Frank Isakson Prize from the APS, and the Max Planck Research Award. He is also a distinguished professor at Fudan University in Shanghai and an elected member of the US National Academy of Sciences, the American Academy of Arts and Sciences, the Chinese Academy of Sciences, and Academia Sinica.